GSM growth pattern tester

GSM growth pattern tester
Specifications

| Product Introduction

The growth pattern tester (Crystal Growth Striation Measurement) is an instrument based on the shading method, which changes the subtle changes of the Refractive Index into a large light and dark difference to observe the internal quality of crystals and Optics components. Usually in transparent solids, gases, and liquids that are difficult to visualize internally, the Refractive Index of light varies due to the density gradient of the medium. Uneven states in transparent gases, liquids, and solids act as density gradients through which light can bend. The grain shading method is a Optics observation method that visualizes changes in Refractive Index (the direction in which light travels). The growth pattern tester can be used to observe and analyze the crystal growth lines, study the key parameters of crystal growth, control the quality of crystal growth, evaluate the purity and defects of crystal, optimize the crystal growth process, and improve the quality and performance of crystal.

| Application areas

· optics material defect analysis

· observation on Growth Pattern of Crystal Material

· our products full process of independent production, can be customized according to customer needs, standard products refer to the following list:

| Typical Reference Indicators

| Typical package size diagram (mm)

GSM growth pattern tester

StrongLabs
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